The following Abstracts of journal literature and patent specifications are taken, with kind permission, from Imaging Abstracts, published by Pira International on behalf of The Royal Photographic Society of Great Britain. These abstracts are dated up to 2003 and this facility is no longer maintained.
The abstracts are Copyright © 1997-2004 Pira International on behalf of the RPS. Original documents are in English unless otherwise stated. The abstracts published here are those which cover aspects of Infrared imaging and are made available here for informational purposes only. No liability can be accepted for the accuracy of the information given or any use that is made of it.
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Booras SW, Chabries DM (Brigham Young University Provo USA)
I S and T Reporter vol. 16, no. 2, 2001, pp 1-4
One of the consequences of the eruption of Mt. Vesuvius in A.D. 79 was the burial of an extensive collection of papyri under the ejected lava and other material. Some of this collection has been separated into discrete sheets, and techniques of multispectral imaging have been used for their deciphering. Images obtained with infrared radiation of 950 nm wavelength have proved very satisfactory.
Dragnea B, Preusser J, Szarko J M, Leone S R, Hinsberg W D (Colorado University USA)
J. Vac. Sci. Technol. vol. 19, no. 1, 2001, pp 142-152
A fibre-based infrared near-field microscope, using radiation of wavelength 3 µm, has been used to study the image characteristics of a chemically amplified photoresist, 250 nm thick, which had been patterned by ultraviolet radiation. 37 refs.
Chrzanowski K, Park SN (Military University of Technology Warsaw Poland)
Infrared Phys. Technol. vol. 42, no. 2, 2001, pp 101-105
The American Society for Testing of Materials has issued two standards for the evaluation of commercial thermal cameras. It is suggested that the instructions for the practical usage of information gained are inadequate, and more detailed methods are proposed. 12 refs.
Salamov B G, Kurt Y K, Lebedeva N N, Altindal S, Ozer M (Gazi University Ankara Turkey, Baku State University Azerbaijan)
Imag. Sci. J. vol. 49, no. 4, 2001, pp 197-203
A description is given of a novel type of incoherent-to-coherent infrared image converter, using a GaAs photoconductor in conjunction with a bismuth silicate crystal. The threshold sensitivity of the converter is calculated on theoretical grounds, and the agreement with a practical evaluation is reasonable. The advantages of the device are indicated. 28 refs.
Simanovskii D, Palanker D, Cohn K, Smith T (Stamford University USA)
Appl. Phys. Lett. vol. 79, no. 8, 2001, pp 1214-1216
A novel technique of near-field infrared microscopy is described in which a semiconductor produces photoinduced reflectivity to generate a transient mirror with a small central aperture, which can act as an infrared probe. The instrument is able to give a resolution better than lambda/5 for 6.25 µm radiation. The advantages of the procedure are discussed. 7 refs.
Akhremitchen B B, Pollack S, Walker G C (Pittsburgh University USA)
Langmuir vol. 17, no. 9, 2001, pp 2774-2781
The surface of a cast polymer film has been studied by means of an apertureless probe method using infrared near-field microscopy. Two different procedures were described, and their relative merits were considered. 38 refs.
Jallad K N, Ben-Amoz D (Purdue University West Lafayette USA)
Mater. Sci. Technol. vol. 17, no. 11, 2001, pp 1479-1486
Near infrared Raman imaging microscopy is a novel technique which has been devised for both the identification and mapping of the distribution of iron oxides and oxyhydroxides in minerals, corroded steel surfaces and other materials. Its mode of action is described and its ability to distinguish between microstructures indicated. 15 refs.